What was the results of Alpha Dent implants surface research?
Did you know that in 2008 the University of Cologne, Germany and the BDIZ EDI (European Association of Dental Implantology) with its Quality and Research (Q&R) Committee performed a scanning electron microscopic study and analyzed the surfaces of 23 enossal titanium implants of several manufacturers at the Interdisciplinary Policlinic for Oral Surgery and Implantology, Department for Craniomaxillofacial and Plastic Surgery, University Cologne.
The tested implants showed isolated and/or extensive deposits. Depending on manufacturing process, accumulations of organic material (carbon) or inorganic material like aluminum, silicon, phosphor, sulfur, chlorine, potassium and calcium were found.
In 2011-2012 was performed the same protocol on 57 dental implants from different manufacturers. However, the manufacturing of implants requires an adequate system of quality controls. Although some manufacturers have made substantial improvements since first survey in 2008, the study in 2011-2012 again singled out a few implants with larger areas of surface blasting residue and selective organic impurities.
The BDIZ EDI , representing more than 5,500 active implantologists in Europe, was asked in its general meeting to continue these analyses periodically and to publish the results in the European EDI Journal.
While using the same material an methods regarding the technical setup this study allows comparisons to the results of previous studies.
As a continuance of the two studies cited above the aim of this study is to verify improvements of manufacturing and quality management as well as to demonstrate the high quality level of the participating manufacturers and implant companies.
The study quantitative and qualitative element-analysis of implant-surfaces by SEM and EDX was carried out by Dr. Dirk U. Duddeck from September 2014 to March 2015. Phenom ProX Scanning Electron Microscope, equipped with high-sensitivity backscattered electron detector (compositional & topographical modes) were used.
Phenom ProX Scanning Electron Microscope, equipped with high-sensitivity backscattered electron detector (compositional & topographical modes) were used.
For EDX Analysis: Detector type: Silicon Drift Detector (SDD), thermoelectrically cooled (LN 2 free), detector active Area: 25 mm 2, X-ray window: Ultra-thin Silicon Nitride (Si 3 N 4 ) window allowing detection of elements C to Am, energy resolution Mn Kα ≤ 140 eV.
Max. Input count rate: 300,000 cps
As a result the Alpha Dent Active implants sample provided by Alpha Dent Implants for this analysis showed no significant traces of inorganic or organic residues from the production process and high mechanical precision.
The quality of Alpha Dent Implants surface is proved by this research.
In conclusion the great reliability implants of Alpha Dent is guaranteed for a long time!